SN74BCT8374ADWE4

SN74BCT8374, SN74BCT8374ADW, SN74BCT8374ADWE4, SN74BCT8374ADWG4, SN74BCT8374ADWR, SN74BCT8374ADWRE4, SN74BCT8374ADWRG4, SN74BCT8374ANT, SN74BCT8374ANTE4

Scan Test Device with D-Type Edge-Triggered Flip-Flops

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Description

Parameters

Parameter		SN74BCT8374ADW	SN74BCT8374ADWE4	SN74BCT8374ADWG4	SN74BCT8374ADWR	SN74BCT8374ADWRE4	SN74BCT8374ADWRG4	SN74BCT8374ANT	SN74BCT8374ANTE4
Type of mounting a component on a board/circuit	Mount	Surface mount	Surface mount	Surface mount	Surface mount	Surface mount	Surface mount	Through-hole	Through-hole
IC package	Package	24-SOIC (7.5мм ширина)	24-SOIC (7.5мм ширина)	24-SOIC (7.5мм ширина)	24-SOIC (7.5мм ширина)	24-SOIC (7.5мм ширина)	24-SOIC (7.5мм ширина)	24-DIP (300 mil)	24-DIP (300 mil)
IC series	Series	74BCT
Manufacturer	Manufacturer	Texas Instruments
Working temperature	t_work	0 ~ 70
Supply voltage	V_sup	4.5 V ~ 5.5 V